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Instrumentation Optique

Laser Linewidth/Frequency Noise Measurement System
Laser Linewidth/Frequency Noise Measurement System
 

Description                                                                                                                                                                                              

OEwaves’ ultra-narrow Automated Laser Linewidth and Frequency Noise Measurement System u ti lizes a homodyne methodology for automated measurement capable of tes ti ng ultra-low phase noise laser sources. The user friendly test system is capable of rapidly measuring <100 Hz of Lorentzian linewidth of a laser source without the complicated setup typically required to make such a narrow linewidth measurement.

This homodyne based system is unique in wide band measurement without requiring another low noise reference laser source. The complete system operates with ease, speed and precision, and a simple graphic user interface via a tablet, without requiring any additional test equipment. The unmatched ultra-low phase/frequency noise measurement system is scalable to various input wavelengths and capable of low relative intensity noise (RIN) measurement.

 

FEATURES

  • Ultra-Narrow/Low Linewidth/ Frequency Noise Measurement
  • Fast Real-Time Measurement
  • RIN Measurements
  • Fully Automated
  • No Low Noise Reference Source Required
  • User Friendly Interface
  • Simple PC-based Operation
  • 1U x 19” Rack System
  • Customisable Configurations, Upgrades and Options

 

Optional Configurations

  • Extended input wavelength range measurements within 1-2 um
  • Extended Input Power Range
  • Performance Level and Frequency
  • Range Options and Upgrades

Laser Linewidth and Frequency Noise Measurement System